New - in-situ micromechanical testing system designed for use within a Scanning Electron Microscope (SEM) environment

The procuring entity seeks to acquire a state-of-the-art in-situ micromechanical testing module for integration into an existing JEOL JSM-IT300 Scanning Electron Microscope (SEM). The system will expand the group’s capabilities in advanced materials research, enabling high-precision micromechanical testing and simultaneous microstructural analysis.